• 2016.03.24

    Advanced program is available here.

  • 2016.02.29

    Paper submission is closed.

  • 2015.11.16

    First call for papers is available here.

  • 2015.10.01

    Website pre open(This post will be removed).


We are pleased to announce the inauguration of the International Conference on X-ray Optics, Detectors, Sources, and their Applications (XOPT`16) as part of the Optics and Photonics International Congress 2016 (OPIC2016) in Yokohama, Japan.

X-rays have facilitated a number of key scientific discoveries in recent years. Continuous technological breakthroughs in X-ray sources, optics, and detectors have laid the foundation for these achievements. For this conference, we are inviting leading experts in these fields from around the world to exchange the latest status of the developments, and to discuss the future. We believe it is appropriate to host this conference in Japan, as the Japanese scientific community has contributed significantly to the development of state-of-the-art X-ray optical technologies over the last fifty years.

We are happy to welcome you to participate in and enjoy the Conference.

Conference Chairs

Tetsuya Ishikawa & Kazuto Yamauchi

Sponsor and support

RIKEN SPring-8 Center
Osaka University Research Center for Ultra-Precision Science and Technology

Important date

Abstract submission: 8 Feb.2016 , Monday(Extended)
Early Registration: April 15, 2016, Friday


XOPT covers the recent progress of X-ray science and technology with topics including the following fields:

X-ray optical components

High-resolution monochromators
High-resolution spectrometers/analyzers
Beamline monochromators/mirrors
Focusing optics (reflective, refractive, diffractive)
Phase retarders and polarization optics
Diagnostics tools (intensity/spatial/spectral/temporal/coherence/wavefront)

X-ray sources

Synchrotron radiation sources
Free electron lasers
High-order harmonic generation (HHG) sources

X-ray Detectors

Imaging Detectors
Spectroscopic detector
Superconducting detector


X-ray imaging/microscopy
X-ray inelastic scattering
Time resolved analysis
X-ray correlation spectroscopy
Nonlinear X-ray optics